@inproceedings{bf647ed00e6e4dde9084f4a0d83bc229,
title = "Monitoring insulator contamination level under dry condition with a microwave reflectometer",
abstract = "Build-up of surface contamination on high voltage insulators can lead to an increase in leakage current and partial discharge, which may eventually develop into flashover. Conventional contamination level monitoring systems based on leakage current, partial discharge, infrared and ultraviolet camera are only effective when the contamination layer has been wetted by rain, fog or condensation; under these conditions flashover might occur before there is time to implement remedial measures such as cleaning. This paper describes studies exploring the feasibility of applying microwave reflectometry techniques to monitor insulator contamination levels. This novel method measures the power generated by a 10.45 GHz source and reflected at the insulator contamination layer. A theoretical model establishes the relationship between equivalent salt deposit density (ESDD) levels, dielectric properties and geometry of contamination layers. Experimental results demonstrate that the output from the reflectometer is able to clearly distinguish between samples with different contamination levels under dry conditions. This contamination monitoring method could potentially provide advance warning of the future failure of wet insulators in climates where insulators can experience dry conditions for extended periods.",
keywords = "pollution measurement, insulators, microwave reflectometry, insulator contamination",
author = "Yan Jiang and Scott McMeekin and Alistair Reid and Azam Nekahi and Martin Judd and Alan Wilson",
year = "2015",
month = oct,
day = "15",
doi = "10.1109/ICPADM.2015.7295433",
language = "English",
isbn = "9781479989034",
series = "Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials",
publisher = "IEEE",
pages = "959 -- 962",
booktitle = "2015 IEEE 11th International Conference on the Properties and Applications of Dielectric Materials (ICPADM)",
address = "United States",
}