Image formation in conventional brightfield reflection microscopes with optical sectioning property via structured illumination

    Research output: Contribution to journalArticle

    Abstract

    We present a theoretical analysis of the image formation in conventional brightfield reflection microscopes with optical sectioning property via structured illumination. We show that the optically sectioned images obtained with this approach possess the optical sectioning strengths comparable to those obtained with the confocal microscope. We further show that the transfer function behaviour is directly comparable to that of the true confocal instrument. Some effects of spherical aberrations are included in the analysis. The theoretical considerations are compared with and confirmed by experimental results.
    Original languageEnglish
    Pages (from-to)302-310
    Number of pages9
    JournalMicron
    Volume39
    Issue number3
    DOIs
    Publication statusPublished - Apr 2008

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    Lighting
    Image processing
    Microscopes
    Optical properties
    illumination
    microscopes
    optical properties
    Aberrations
    transfer functions
    Transfer functions
    aberration

    Keywords

    • structured illumination
    • optical sectioning
    • optical microscopy
    • brightfield microscopy
    • spherical aberrations

    Cite this

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    title = "Image formation in conventional brightfield reflection microscopes with optical sectioning property via structured illumination",
    abstract = "We present a theoretical analysis of the image formation in conventional brightfield reflection microscopes with optical sectioning property via structured illumination. We show that the optically sectioned images obtained with this approach possess the optical sectioning strengths comparable to those obtained with the confocal microscope. We further show that the transfer function behaviour is directly comparable to that of the true confocal instrument. Some effects of spherical aberrations are included in the analysis. The theoretical considerations are compared with and confirmed by experimental results.",
    keywords = "structured illumination, optical sectioning, optical microscopy, brightfield microscopy, spherical aberrations",
    author = "Dejan Karadaglic",
    year = "2008",
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    doi = "10.1016/j.micron.2007.10.001",
    language = "English",
    volume = "39",
    pages = "302--310",
    journal = "Micron",
    issn = "0968-4328",
    publisher = "Elsevier B.V.",
    number = "3",

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    T1 - Image formation in conventional brightfield reflection microscopes with optical sectioning property via structured illumination

    AU - Karadaglic, Dejan

    PY - 2008/4

    Y1 - 2008/4

    N2 - We present a theoretical analysis of the image formation in conventional brightfield reflection microscopes with optical sectioning property via structured illumination. We show that the optically sectioned images obtained with this approach possess the optical sectioning strengths comparable to those obtained with the confocal microscope. We further show that the transfer function behaviour is directly comparable to that of the true confocal instrument. Some effects of spherical aberrations are included in the analysis. The theoretical considerations are compared with and confirmed by experimental results.

    AB - We present a theoretical analysis of the image formation in conventional brightfield reflection microscopes with optical sectioning property via structured illumination. We show that the optically sectioned images obtained with this approach possess the optical sectioning strengths comparable to those obtained with the confocal microscope. We further show that the transfer function behaviour is directly comparable to that of the true confocal instrument. Some effects of spherical aberrations are included in the analysis. The theoretical considerations are compared with and confirmed by experimental results.

    KW - structured illumination

    KW - optical sectioning

    KW - optical microscopy

    KW - brightfield microscopy

    KW - spherical aberrations

    U2 - 10.1016/j.micron.2007.10.001

    DO - 10.1016/j.micron.2007.10.001

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    JF - Micron

    SN - 0968-4328

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