Fault location and diagnosis in medium voltage shielded power cable

Alistair Reid; Chengke Zhou; Donald Hepburn; Martin D. Judd; Wah Hoon Siew; Philip  Withers

doi:10.1109/TDEI.2013.6451336

Fault location and diagnosis in medium voltage shielded power cable

Alistair Reid, Chengke Zhou, Donald Hepburn, Martin D. Judd, Wah Hoon Siew, Philip Withers

Research output: Contribution to journal › Article

Abstract

This paper presents a case study on fault location, characterization and diagnosis in a length of shielded 11 kV medium voltage ethylene-propylene rubber (EPR) power cable. The defect was identified on-site as a low resistance fault occurring between the sheath and the core. A 43 m section was removed for further analysis. The fault resistance was characterized and the location of the defect pinpointed to within a few cm using a combination of time-difference-of-arrival location and infra-red imaging. A combination of X-ray computed tomography, scanning electron microscopy and energy dispersive X-ray spectroscopy were then applied to characterize any abnormalities in the dielectric surrounding the breakdown region.

Original language	English
Pages (from-to)	10-18
Number of pages	9
Journal	IEEE Transactions on Dielectrics and Electrical Insulation
Volume	20
Issue number	1
DOIs	https://doi.org/10.1109/TDEI.2013.6451336
Publication status	Published - Feb 2012

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Keywords

condition monitoring
power system faults
dielectric breakdown
power cable insulation
X-ray imaging

Cite this

Reid, A., Zhou, C., Hepburn, D., Judd, M. D., Siew, W. H., & Withers, P. (2012). Fault location and diagnosis in medium voltage shielded power cable. IEEE Transactions on Dielectrics and Electrical Insulation, 20(1), 10-18. https://doi.org/10.1109/TDEI.2013.6451336

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abstract = "This paper presents a case study on fault location, characterization and diagnosis in a length of shielded 11 kV medium voltage ethylene-propylene rubber (EPR) power cable. The defect was identified on-site as a low resistance fault occurring between the sheath and the core. A 43 m section was removed for further analysis. The fault resistance was characterized and the location of the defect pinpointed to within a few cm using a combination of time-difference-of-arrival location and infra-red imaging. A combination of X-ray computed tomography, scanning electron microscopy and energy dispersive X-ray spectroscopy were then applied to characterize any abnormalities in the dielectric surrounding the breakdown region.",

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10.1109/TDEI.2013.6451336