Electric field distribution on the outer surface of lower porcelain of an OIP transformer bushing-accumulation of metal-contained colloid

Azam Nekahi, Brian Stewart, Scott McMeekin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The Finite Element Method (FEM) is commonly used for electric field simulation. This paper presents, for the first time, the calculation of the electric field intensity on one phase of a 245-kV OIP condenser bushing by FEM considering the effect of metallic-contained colloids deposition on the outer surface of lower porcelain. The distribution of the electric field on the surface of the bushing is calculated and the location of maximum electric field intensity of the bushing is determined. The spots having the maximum electric field intensity are the vulnerable areas from which the partial discharge may initiate. The extension of stained area due to the trapping effect of electric field is been considered.
Original languageEnglish
Title of host publicationProceedings of the 11th IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM '15)
PublisherIEEE
Pages632 - 635
Number of pages4
DOIs
Publication statusPublished - 2015

Fingerprint

bushings
porcelain
transformers
colloids
electric fields
metals
finite element method
condensers
trapping

Keywords

  • finite element method
  • electric field
  • simulation
  • bushings

Cite this

Nekahi, A., Stewart, B., & McMeekin, S. (2015). Electric field distribution on the outer surface of lower porcelain of an OIP transformer bushing-accumulation of metal-contained colloid. In Proceedings of the 11th IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM '15) (pp. 632 - 635). IEEE. https://doi.org/10.1109/ICPADM.2015.7295351
Nekahi, Azam ; Stewart, Brian ; McMeekin, Scott. / Electric field distribution on the outer surface of lower porcelain of an OIP transformer bushing-accumulation of metal-contained colloid. Proceedings of the 11th IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM '15). IEEE, 2015. pp. 632 - 635
@inproceedings{69772909eddb4d358c28222ae742f519,
title = "Electric field distribution on the outer surface of lower porcelain of an OIP transformer bushing-accumulation of metal-contained colloid",
abstract = "The Finite Element Method (FEM) is commonly used for electric field simulation. This paper presents, for the first time, the calculation of the electric field intensity on one phase of a 245-kV OIP condenser bushing by FEM considering the effect of metallic-contained colloids deposition on the outer surface of lower porcelain. The distribution of the electric field on the surface of the bushing is calculated and the location of maximum electric field intensity of the bushing is determined. The spots having the maximum electric field intensity are the vulnerable areas from which the partial discharge may initiate. The extension of stained area due to the trapping effect of electric field is been considered.",
keywords = "finite element method, electric field, simulation, bushings",
author = "Azam Nekahi and Brian Stewart and Scott McMeekin",
year = "2015",
doi = "10.1109/ICPADM.2015.7295351",
language = "English",
pages = "632 -- 635",
booktitle = "Proceedings of the 11th IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM '15)",
publisher = "IEEE",

}

Nekahi, A, Stewart, B & McMeekin, S 2015, Electric field distribution on the outer surface of lower porcelain of an OIP transformer bushing-accumulation of metal-contained colloid. in Proceedings of the 11th IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM '15). IEEE, pp. 632 - 635. https://doi.org/10.1109/ICPADM.2015.7295351

Electric field distribution on the outer surface of lower porcelain of an OIP transformer bushing-accumulation of metal-contained colloid. / Nekahi, Azam; Stewart, Brian; McMeekin, Scott.

Proceedings of the 11th IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM '15). IEEE, 2015. p. 632 - 635.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Electric field distribution on the outer surface of lower porcelain of an OIP transformer bushing-accumulation of metal-contained colloid

AU - Nekahi, Azam

AU - Stewart, Brian

AU - McMeekin, Scott

PY - 2015

Y1 - 2015

N2 - The Finite Element Method (FEM) is commonly used for electric field simulation. This paper presents, for the first time, the calculation of the electric field intensity on one phase of a 245-kV OIP condenser bushing by FEM considering the effect of metallic-contained colloids deposition on the outer surface of lower porcelain. The distribution of the electric field on the surface of the bushing is calculated and the location of maximum electric field intensity of the bushing is determined. The spots having the maximum electric field intensity are the vulnerable areas from which the partial discharge may initiate. The extension of stained area due to the trapping effect of electric field is been considered.

AB - The Finite Element Method (FEM) is commonly used for electric field simulation. This paper presents, for the first time, the calculation of the electric field intensity on one phase of a 245-kV OIP condenser bushing by FEM considering the effect of metallic-contained colloids deposition on the outer surface of lower porcelain. The distribution of the electric field on the surface of the bushing is calculated and the location of maximum electric field intensity of the bushing is determined. The spots having the maximum electric field intensity are the vulnerable areas from which the partial discharge may initiate. The extension of stained area due to the trapping effect of electric field is been considered.

KW - finite element method

KW - electric field

KW - simulation

KW - bushings

U2 - 10.1109/ICPADM.2015.7295351

DO - 10.1109/ICPADM.2015.7295351

M3 - Conference contribution

SP - 632

EP - 635

BT - Proceedings of the 11th IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM '15)

PB - IEEE

ER -

Nekahi A, Stewart B, McMeekin S. Electric field distribution on the outer surface of lower porcelain of an OIP transformer bushing-accumulation of metal-contained colloid. In Proceedings of the 11th IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM '15). IEEE. 2015. p. 632 - 635 https://doi.org/10.1109/ICPADM.2015.7295351