| Original language | English |
|---|---|
| Publication status | Published - Aug 2011 |
Cite this
Reid, A., Hu, X., Judd, M. D., & Siew, W. H. (2011). Defect location and characterisation in an EPR MV cable using TDOA and thermal techniques.
Defect location and characterisation in an EPR MV cable using TDOA and thermal techniques
Alistair Reid, Xiao Hu, Martin D. Judd, Wah Hoon Siew
Research output: Contribution to conference › Paper