Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon

N.P. Johnson, A.Z. Khokhar, H.M.H. Chong, R.M. De La Rue, S. McMeekin

Research output: Contribution to journalArticle

Abstract

The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-circuit method for the calculation of the first and second resonant wavelengths.
Original languageUndefined/Unknown
Pages (from-to)1117-1119
Number of pages3
JournalElectronics Letters
Volume42
Issue number19
DOIs
Publication statusPublished - 14 Sep 2006

Keywords

  • silicon
  • optical resonators
  • reflectivity
  • finite difference time-domain analysis
  • metallic thin films
  • equivalent circuits
  • metamaterials
  • infrared spectra

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