Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon

N.P. Johnson; A.Z. Khokhar; H.M.H. Chong; R.M. De La Rue; S. McMeekin

doi:10.1049/el:20062212

Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon

N.P. Johnson, A.Z. Khokhar, H.M.H. Chong, R.M. De La Rue, S. McMeekin

SCEBE School Office

Research output: Contribution to journal › Article › peer-review

27 Citations (Scopus)

Abstract

The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-circuit method for the calculation of the first and second resonant wavelengths.

Original language	Undefined/Unknown
Pages (from-to)	1117-1119
Number of pages	3
Journal	Electronics Letters
Volume	42
Issue number	19
DOIs	https://doi.org/10.1049/el:20062212
Publication status	Published - 14 Sep 2006

Keywords

silicon
optical resonators
reflectivity
finite difference time-domain analysis
metallic thin films
equivalent circuits
metamaterials
infrared spectra

Documents and Links

10.1049/el:20062212

Cite this

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title = "Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon",

abstract = "The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-circuit method for the calculation of the first and second resonant wavelengths.",

keywords = "silicon, optical resonators , reflectivity, finite difference time-domain analysis, metallic thin films, equivalent circuits, metamaterials, infrared spectra",

author = "N.P. Johnson and A.Z. Khokhar and H.M.H. Chong and {De La Rue}, R.M. and S. McMeekin",

year = "2006",

month = sep,

day = "14",

doi = "10.1049/el:20062212",

language = "Undefined/Unknown",

volume = "42",

pages = "1117--1119",

journal = "Electronics Letters",

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T1 - Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon

AU - Johnson, N.P.

AU - Khokhar, A.Z.

AU - Chong, H.M.H.

AU - De La Rue, R.M.

AU - McMeekin, S.

PY - 2006/9/14

Y1 - 2006/9/14

N2 - The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-circuit method for the calculation of the first and second resonant wavelengths.

AB - The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-circuit method for the calculation of the first and second resonant wavelengths.

KW - silicon

KW - optical resonators

KW - reflectivity

KW - finite difference time-domain analysis

KW - metallic thin films

KW - equivalent circuits

KW - metamaterials

KW - infrared spectra

UR - http://digital-library.theiet.org/content/journals/10.1049/el_20062212

UR - http://ieeexplore.ieee.org/document/1705814/

U2 - 10.1049/el:20062212

DO - 10.1049/el:20062212

M3 - Article

VL - 42

SP - 1117

EP - 1119

JO - Electronics Letters

JF - Electronics Letters

SN - 0013-5194

IS - 19

ER -

Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon

Abstract

Keywords

Documents and Links

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