Abstract
The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-circuit method for the calculation of the first and second resonant wavelengths.
| Original language | Undefined/Unknown |
|---|---|
| Pages (from-to) | 1117-1119 |
| Number of pages | 3 |
| Journal | Electronics Letters |
| Volume | 42 |
| Issue number | 19 |
| DOIs | |
| Publication status | Published - 14 Sep 2006 |
Keywords
- silicon
- optical resonators
- reflectivity
- finite difference time-domain analysis
- metallic thin films
- equivalent circuits
- metamaterials
- infrared spectra
Cite this
Johnson, N. P., Khokhar, A. Z., Chong, H. M. H., De La Rue, R. M., & McMeekin, S. (2006). Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon. Electronics Letters, 42(19), 1117-1119. https://doi.org/10.1049/el:20062212