Change in pattern of void-type PD with ageing

Dongsheng Guo; Donald M. Hepburn; Alan Nesbitt; Chengke Zhou

doi:10.1109/CMD.2008.4580242

Change in pattern of void-type PD with ageing

Dongsheng Guo, Donald M. Hepburn, Alan Nesbitt, Chengke Zhou

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

The measurement and assessment of partial discharge (PD) activity is used both for condition assessment of high voltage plant (by operators) and for quality control (by manufacturers). Except for the online circumstances, the measurement usually lasts for a short period of time while higher than working stress is applied. The resulting pattern of discharge data, when compared with a knowledge base of PD patterns of different types of defects is a crucial factor in diagnosing the condition of the insulation system in the plant.

Original language	English
Title of host publication	International Conference on Condition Monitoring and Diagnosis
Publisher	IEEE
ISBN (Print)	9781424416219
DOIs	https://doi.org/10.1109/CMD.2008.4580242
Publication status	Published - 1 Jan 2008

Keywords

partial discharge
high voltage
PD
insulation system

Documents and Links

10.1109/CMD.2008.4580242

Cite this

@inproceedings{bdc507e7e35340599f9ec59d38e90225,

title = "Change in pattern of void-type PD with ageing",

abstract = "The measurement and assessment of partial discharge (PD) activity is used both for condition assessment of high voltage plant (by operators) and for quality control (by manufacturers). Except for the online circumstances, the measurement usually lasts for a short period of time while higher than working stress is applied. The resulting pattern of discharge data, when compared with a knowledge base of PD patterns of different types of defects is a crucial factor in diagnosing the condition of the insulation system in the plant.",

keywords = "partial discharge, high voltage, PD, insulation system",

author = "Dongsheng Guo and Hepburn, {Donald M.} and Alan Nesbitt and Chengke Zhou",

note = "<p>Paper presented at the Conference on Condition Monitoring and Diagnosis, Beijing, China, 21-24 April 2008. Proceedings ISBN: 9781424416219.</p>",

year = "2008",

month = jan,

day = "1",

doi = "10.1109/CMD.2008.4580242",

language = "English",

isbn = "9781424416219",

booktitle = "International Conference on Condition Monitoring and Diagnosis",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - Change in pattern of void-type PD with ageing

AU - Guo, Dongsheng

AU - Hepburn, Donald M.

AU - Nesbitt, Alan

AU - Zhou, Chengke

N1 - <p>Paper presented at the Conference on Condition Monitoring and Diagnosis, Beijing, China, 21-24 April 2008. Proceedings ISBN: 9781424416219.</p>

PY - 2008/1/1

Y1 - 2008/1/1

N2 - The measurement and assessment of partial discharge (PD) activity is used both for condition assessment of high voltage plant (by operators) and for quality control (by manufacturers). Except for the online circumstances, the measurement usually lasts for a short period of time while higher than working stress is applied. The resulting pattern of discharge data, when compared with a knowledge base of PD patterns of different types of defects is a crucial factor in diagnosing the condition of the insulation system in the plant.

AB - The measurement and assessment of partial discharge (PD) activity is used both for condition assessment of high voltage plant (by operators) and for quality control (by manufacturers). Except for the online circumstances, the measurement usually lasts for a short period of time while higher than working stress is applied. The resulting pattern of discharge data, when compared with a knowledge base of PD patterns of different types of defects is a crucial factor in diagnosing the condition of the insulation system in the plant.

KW - partial discharge

KW - high voltage

KW - PD

KW - insulation system

U2 - 10.1109/CMD.2008.4580242

DO - 10.1109/CMD.2008.4580242

M3 - Conference contribution

SN - 9781424416219

BT - International Conference on Condition Monitoring and Diagnosis

PB - IEEE

ER -

Change in pattern of void-type PD with ageing

Abstract

Keywords

Documents and Links

Fingerprint

Cite this