A novel fault localization method based on monitoring of sheath current in a cross-bonded HV cable system

Mingzhen Li, Wenjun Zhou, Chunlin Wang, Leiming Yao, Mengting Su, Xiaojun Huang, Chengke Zhou*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)


In order to improve the practice in operation and maintenance of high voltage (HV) cable circuit and localize short circuit fault accurately and in a timely manner, this paper proposes a fault localization method based on the monitoring of sheath current in cross-bonded HV cable circuits. The fault current flow can be identified by analyzing the fundamental component of sheath current, which can be obtained by Fast Fourier Transform (FFT) of the monitored sheath current. The cable section where a fault occurs can be localized as both ends of the cable section current would flow in opposite direction. The sheath current signals in different fault location within different sections have been simulated with a selected high voltage cable circuit and under typical operational mode. A set of fault localization criteria have been proposed. Results indicate that the proposed method is feasible and effective in localization of HV cable short circuit faults.

Original languageEnglish
Title of host publication2017 IEEE Electrical Insulation Conference (EIC)
Number of pages4
ISBN (Electronic)9781509039678
ISBN (Print)9781509039654
Publication statusPublished - 10 Aug 2017
Event35th IEEE Electrical Insulation Conference - Sheraton Inner Harbor Hotel, Baltimore, United States
Duration: 11 Jun 201714 Jun 2017

Publication series

Name2017 IEEE Electrical Insulation Conference, EIC 2017


Conference35th IEEE Electrical Insulation Conference
Abbreviated titleEIC 2017
Country/TerritoryUnited States


  • fault localization
  • High voltage cable
  • on-line monitoring
  • sheath current
  • short-circuit fault

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science (miscellaneous)
  • Electronic, Optical and Magnetic Materials
  • Polymers and Plastics


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