Best paper award

  • Javed, W. (Recipient) & Chen, D. (Recipient)

Prize: Prize (including medals and awards)

Description

Bests paper award
Degree of recognitionInternational

Awarded at event

Event title29th IEEE International Symposium on Industrial Electronics
LocationOnlineShow on map
Period17 Jun 2019 → 19 Jul 2020

Keywords

  • Date driven
  • DC microgrid
  • Best paper
  • fault localization